Influence of metal induced crystallization parameters on the performance of polycrystalline silicon thin film transistors

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)
Original languageEnglish
Pages (from-to)102-106
Number of pages5
JournalThin Solid Films
Volume487
Issue number1-2
DOIs
Publication statusPublished - 1 Sep 2005

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