Nickel-Titanium (Ni-Ti) thin film shape memory alloys (SMAs) have been widely projected as a novel material, which can be utilized in microdevices. Characterization of their physical properties and its correlation with phase transformations has been a challenging issue. In the present study, X-ray beam diffraction has been utilised to obtain the structural information at different temperatures while cooling. Simultaneously, electrical resistivity (ER) was measured in the phase transformation temperature range. The variation of ER and integral area of the individual diffraction peaks of the different phases as a function of temperature have been compared. A mismatch between the conventional interpretation of ER variation and the results of the XRD data has been clearly identified.